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    Title :

    The effects of TID on wear-out of advanced flash memories


    Contributors:
    Nguyen, D. (author) / Scheick, L. (author) / Swift, G. M. (author) / Guertin, S. M. (author)

    Conference:

    Nuclear and Space Raddiation Effects Conference


    Publication date :

    2000-07-06


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English





    Evaluation of Radiation Effects in Flash Memories

    Miyahira, T. / Swift, G. | NTRS | 1998



    TID, SEE and radiation induced failures in advanced flash memories

    Scheick, Leif Z. / Nguyen, Duc N. | NTRS | 2003


    Advanced mass memories

    SCHWEE, L. / ANDERSON, W. / LIU, Y. et al. | AIAA | 1977