Recently, we proposed a general technique to wed ultrafast laser spectroscopy and Scanning Probe Microscopies (SPM) to obtain simultaneous picosecond time and atomic space resolution. In the experiment, a short laser pulse activated a photoconductive switch on a SOS transmission line, in order to generate short voltage pulses. While the tip was in tunneling range from one of the conductors of the transmission line, a second laser pulse gated the Scanning Tunneling Microscope (STM) tip assembly. Thus, we could excite the tunneling gap of the STM with a short voltage pulse, and measure its response. To better understand these measurements, we now model the experiment by an equivalent circuit.
Progress in ultrafast scanning probe microscopy
Proceedings of LEOS'94 ; 2 ; 207-208 vol.2
01.01.1994
191317 byte
Aufsatz (Konferenz)
Elektronische Ressource
Englisch
Progress in Ultrafast Scanning Probe Microscopy
British Library Conference Proceedings | 1994
|Ultrafast Scanning Probe Microscopy
British Library Conference Proceedings | 1993
|Ultrafast Scanning Probe Microscopy
IEEE | 1993
|Scanning probe microscopy for testing ultrafast electronic devices
British Library Online Contents | 1996
|