A probe card is adapted for testing at least one integrated circuit that integrated on a corresponding at least one die of a semiconductor material wafer. The probe card includes a board adapted for the coupling to a tester apparatus. Several probes are coupled to the board. The probe card includes replaceable elementary units, wherein each unit includes at least one probe for contacting externally-accessible terminals of an integrated circuit under test. The replaceable elementary units are arranged so as to correspond to an arrangement of at least one die on the semiconductor material wafer containing integrated circuits to be tested.


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    Titel :

    Probe card for testing integrated circuits


    Beteiligte:
    PAGANI ALBERTO (Autor:in)

    Erscheinungsdatum :

    2018-08-28


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01R Messen elektrischer Größen , MEASURING ELECTRIC VARIABLES / B62M RIDER PROPULSION OF WHEELED VEHICLES OR SLEDGES , Antrieb von Radfahrzeugen oder Schlitten durch den Fahrer



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    Testing Fixture For Microwave Integrated Circuits

    Romanofsky, Robert / Shalkhauser, Kurt | NTRS | 1989


    RF Testing Of Microwave Integrated Circuits

    Romanofsky, R. R. / Ponchak, G. E. / Shalkhauser, K. A. et al. | NTRS | 1988