Fixtures and techniques are undergoing development. Four test fixtures and two advanced techniques developed in continuing efforts to improve RF characterization of MMIC's. Finline/waveguide test fixture developed to test submodules of 30-GHz monolithic receiver. Universal commercially-manufactured coaxial test fixture modified to enable characterization of various microwave solid-state devices in frequency range of 26.5 to 40 GHz. Probe/waveguide fixture is compact, simple, and designed for non destructive testing of large number of MMIC's. Nondestructive-testing fixture includes cosine-tapered ridge, to match impedance wavequide to microstrip. Advanced technique is microwave-wafer probing. Second advanced technique is electro-optical sampling.


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    Titel :

    RF Testing Of Microwave Integrated Circuits


    Beteiligte:
    Romanofsky, R. R. (Autor:in) / Ponchak, G. E. (Autor:in) / Shalkhauser, K. A. (Autor:in) / Bhasin, K. B. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.07.1988



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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