Ellipsometry provides detailed analysis of infrared optical thin films
LASER FOCUS WORLD ; 46 , 8 ; 31-40
01.01.2010
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.366 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
REFLECTIVE INFRARED ELLIPSOMETRY OF PLASTIC FILMS
British Library Online Contents | 2006
|British Library Conference Proceedings | 2002
|Determination of optical constants of pentacene thin film by spectroscopic ellipsometry
Online Contents | 2010
|British Library Online Contents | 2015
|