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    Title :

    Ellipsometry provides detailed analysis of infrared optical thin films


    Contributors:
    Tiwald, T.E. (author) / Synowicki, R. (author) / Lohneiss, W. (author)

    Published in:

    LASER FOCUS WORLD ; 46 , 8 ; 31-40


    Publication date :

    2010-01-01


    Size :

    10 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    621.366



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