Ellipsometry provides detailed analysis of infrared optical thin films
LASER FOCUS WORLD ; 46 , 8 ; 31-40
2010-01-01
10 pages
Article (Journal)
English
| DDC: | 621.366 |
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
REFLECTIVE INFRARED ELLIPSOMETRY OF PLASTIC FILMS
| British Library Online Contents | 2006
| British Library Conference Proceedings | 2002
Determination of optical constants of pentacene thin film by spectroscopic ellipsometry
| Online Contents | 2010
| British Library Online Contents | 2015