REFLECTIVE INFRARED ELLIPSOMETRY OF PLASTIC FILMS
INTERNATIONAL JOURNAL OF INFRARED AND MILLIMETER WAVES ; 27 , 11 ; 1553-1571
01.01.2006
19 pages
Aufsatz (Zeitschrift)
Englisch
DDC: | 621.3612 |
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Ellipsometry provides detailed analysis of infrared optical thin films
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