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    Titel :

    Infrared spectroscopic ellipsometry on ferroelectric thin films and narrow-gap semiconductors [4795-10]



    Kongress:

    Conference; 2nd, Materials for infrared detectors ; 2002 ; Seattle, WA



    Erscheinungsdatum :

    01.01.2002


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Progress in far-infrared detection technology [4795-21]

    Zhou, Y. D. / Becker, C. R. / Ashokan, R. et al. | British Library Conference Proceedings | 2002


    Sol-gel-derived barium strontium titanate thin films for uncooled infrared detector array applications [4795-18]

    Cheng, J.-G. / Tang, J. / Chu, J. H. et al. | British Library Conference Proceedings | 2002


    High-performance ferroelectric and magnetoresistive materials for next-generation thermal detector arrays [4795-17]

    Todd, M. A. / Donohue, P. P. / Watton, R. et al. | British Library Conference Proceedings | 2002


    QWIP structural optimization (Invited Paper) [4795-07]

    Choi, K. K. / Lin, C.-H. / Leung, K. M. et al. | British Library Conference Proceedings | 2002


    Improved model of HgCdTe's pseudo dielectric function for in-situ ellipsometry data analysis during MBE growth [4795-13]

    Badano, G. / Garland, J. W. / Zhao, J. et al. | British Library Conference Proceedings | 2002