Quality, Reliability, Durability (QRD) and Safety of vehicular Electrical/Electronics (E/E) systems traditionally have resulted from arduous rounds of Design-Built-Test-Fix (DBTF) Reliability and Durability Growth Testing. Such tests have historically required 12-16 or more weeks of Accelerated Life Testing (ALT), for each round of validation in a new product development program. Challenges have arisen from: To resolve these challenges, automakers and E/E suppliers are moving to Physics of Failure (PoF) based durability simulations and reliability assessment solutions performed in a Computer Aided Engineering (CAE) Environment. When PoF knowledge is converted into math models and integrated into CAE durability simulations and reliability assessments tools, it can be determined if and when a device will be susceptible to failure mechanisms over its life cycle.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Moving Automotive Electronics from Reliability/Durability Testing to Virtual Validation Modeling Using a Physics of Failure CAE App


    Additional title:

    Sae International Journal of Passenger Cars- Electronic and Electrical Systems
    Sae Int. J. Passeng. Cars – Electron. Electr. Syst


    Contributors:

    Conference:

    SAE 2014 World Congress & Exhibition ; 2014



    Publication date :

    2014-04-01


    Size :

    8 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




    Moving Automotive Electronics from Reliability/Durability Testing to Virtual Validation Modeling Using a Physics of Failure CAE App

    McLeish, J.G. / Haeberle, R. / Society of Automotive Engineers | British Library Conference Proceedings | 2014


    Accelerated automotive electronics testing: a physics-of-failure approach

    Hu, J. M. | British Library Online Contents | 1996



    Automotive electronics reliability handbook

    Society of Automotive Engineers, Electronics Reliability Subcommittee | TIBKAT | 1987


    Automotive electronics IC reliability

    Straub, R.J. | Tema Archive | 1990