Quality, Reliability, Durability (QRD) and Safety of vehicular Electrical/Electronics (E/E) systems traditionally have resulted from arduous rounds of Design-Built-Test-Fix (DBTF) Reliability and Durability Growth Testing. Such tests have historically required 12-16 or more weeks of Accelerated Life Testing (ALT), for each round of validation in a new product development program. Challenges have arisen from: To resolve these challenges, automakers and E/E suppliers are moving to Physics of Failure (PoF) based durability simulations and reliability assessment solutions performed in a Computer Aided Engineering (CAE) Environment. When PoF knowledge is converted into math models and integrated into CAE durability simulations and reliability assessments tools, it can be determined if and when a device will be susceptible to failure mechanisms over its life cycle.
Moving Automotive Electronics from Reliability/Durability Testing to Virtual Validation Modeling Using a Physics of Failure CAE App
Sae International Journal of Passenger Cars- Electronic and Electrical Systems
Sae Int. J. Passeng. Cars – Electron. Electr. Syst
SAE 2014 World Congress & Exhibition ; 2014
2014-04-01
8 pages
Conference paper
English
British Library Conference Proceedings | 2014
|Accelerated automotive electronics testing: a physics-of-failure approach
British Library Online Contents | 1996
|Methodology of developing reliability validation tests for automotive electronics
Tema Archive | 1995
|Automotive electronics reliability handbook
TIBKAT | 1987
|Automotive electronics IC reliability
Tema Archive | 1990
|