Quality, Reliability, Durability (QRD) and Safety of vehicular Electrical/Electronics (E/E) systems traditionally have resulted from arduous rounds of Design-Built-Test-Fix (DBTF) Reliability and Durability Growth Testing. Such tests have historically required 12-16 or more weeks of Accelerated Life Testing (ALT), for each round of validation in a new product development program. Challenges have arisen from: To resolve these challenges, automakers and E/E suppliers are moving to Physics of Failure (PoF) based durability simulations and reliability assessment solutions performed in a Computer Aided Engineering (CAE) Environment. When PoF knowledge is converted into math models and integrated into CAE durability simulations and reliability assessments tools, it can be determined if and when a device will be susceptible to failure mechanisms over its life cycle.


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    Titel :

    Moving Automotive Electronics from Reliability/Durability Testing to Virtual Validation Modeling Using a Physics of Failure CAE App


    Weitere Titelangaben:

    Sae International Journal of Passenger Cars- Electronic and Electrical Systems
    Sae Int. J. Passeng. Cars – Electron. Electr. Syst


    Beteiligte:

    Kongress:

    SAE 2014 World Congress & Exhibition ; 2014



    Erscheinungsdatum :

    01.04.2014


    Format / Umfang :

    8 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




    Moving Automotive Electronics from Reliability/Durability Testing to Virtual Validation Modeling Using a Physics of Failure CAE App

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    Straub, R.J. | Tema Archiv | 1990