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    Title :

    Accelerated automotive electronics testing: a physics-of-failure approach


    Contributors:
    Hu, J. M. (author)

    Published in:

    Publication date :

    1996-01-01


    Size :

    8 pages



    Type of media :

    Article (Journal)


    Type of material :

    Print


    Language :

    English


    Classification :

    DDC:    531 / 620 / 629.1




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