UNKNOWN


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Modern microprocessor SEE testing


    Contributors:

    Publication date :

    2018-05-21


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English



    Microprocessor based testing of friction materials

    Bansal,A. / Zapf,D. / John Deere,US | Automotive engineering | 1982


    Microprocessor Based Testing of Friction Materials

    Bansal, Ashwani / Zapf, Don | SAE Technical Papers | 1982


    Microprocessor Applications in Vehicle Emissions Testing

    Yakas, Joseph T. / Malik, Mohammed I. / Niewierski, Walter J. | SAE Technical Papers | 1981


    Microprocessor Applications in Vehicle Emissions Testing

    Malik,M.I. / Yakas,J.T. / Niewiersky,W.F. et al. | Automotive engineering | 1981