A Neat Methodology for Microprocessor Upset Testing
Single Event Symposium
2000-04-11
Conference paper
No indication
English
Single-event upset in the Power PC 7400 microprocessor
NTRS | 2002
|Single event upset (SEU) testing at JPL
NTRS | 1987
|Testing Electronic Devices for Single-Event Upset
NTRS | 1986
|Single event upset mitigation testing of SRAM-based FPGAs
British Library Online Contents | 2014
|