We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.
Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program
2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017) ; 2017 ; New Orleans, LA, United States
2017-07-17
Conference paper
No indication
English