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    Title :

    Investigation of High Current Events in Highly Scaled NAND Flash Memories


    Contributors:

    Conference:

    NASA Electric Parts and Packaging Program (NEPP) ; 2011 ; Washington, DC, United States


    Publication date :

    2011-06-15


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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