Report discusses experiments in which ballistic-electron-emission microscopy (BEEM) and related ballistic-hole and charge-carrier-scattering spectroscopies used to investigate transport of electric-charge carriers (electrons and holes) in epitaxial CoSi2/Si system.


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    Title :

    Ballistic-Charge-Carrier Spectroscopy Of CoSi(2)/Si Interfaces


    Contributors:

    Published in:

    Publication date :

    1993-12-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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