Report discusses experiments in which ballistic-electron-emission microscopy (BEEM) and related ballistic-hole and charge-carrier-scattering spectroscopies used to investigate transport of electric-charge carriers (electrons and holes) in epitaxial CoSi2/Si system.
Ballistic-Charge-Carrier Spectroscopy Of CoSi(2)/Si Interfaces
NASA Tech Briefs ; 17 , 12
1993-12-01
Miscellaneous
No indication
English
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