Two reports discuss postirradiation effects in integrated circuits. Presents examples of postirradiation measurements of performances of integrated circuits of five different types: dual complementary metal oxide/semiconductor (CMOS) flip-flop; CMOS analog multiplier; two CMOS multiplying digital-to-analog converters; electrically erasable programmable read-only memory; and semiconductor/oxide/semiconductor octal buffer driver.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Postirradiation Effects In Integrated Circuits


    Contributors:

    Published in:

    Publication date :

    1993-08-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English