Method for obtaining approximate failure-versus-dose-rate curves derived from experiments on failures of SGS 4007 complementary metal oxide/semiconductor (CMOS) integrated circuits irradiated by Co60 and Cs137 radioactive sources.


    Access

    Access via TIB

    Check availability in my library


    Export, share and cite



    Title :

    Failures Of CMOS Devices At Low Radiation-Dose Rates


    Contributors:

    Published in:

    Publication date :

    1990-11-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




    Failures of CMOS Circuits Irradiated At Low Rates

    Goben, Charles A. / Price, William E. | NTRS | 1990


    Effects Of Dose Rates On Radiation Damage In CMOS Parts

    Goben, Charles A. / Coss, James R. / Price, William E. | NTRS | 1990




    An Analysis of Energetic Space Radiation and Dose Rates

    M. O. Burrell / J. W. Watts / J. J. Wright | NTIS | 1968