Method for obtaining approximate failure-versus-dose-rate curves derived from experiments on failures of SGS 4007 complementary metal oxide/semiconductor (CMOS) integrated circuits irradiated by Co60 and Cs137 radioactive sources.
Failures Of CMOS Devices At Low Radiation-Dose Rates
NASA Tech Briefs ; 14 , 11
1990-11-01
Sonstige
Keine Angabe
Englisch
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