Theory of single-event upsets (SEU) (changes in logic state caused by energetic charged subatomic particles) in complementary metal oxide/semiconductor (CMOS) logic devices extended to provide upper-bound estimates of rates of SEU when limited experimental information available and configuration and dimensions of SEU-sensitive regions of devices unknown. Based partly on chord-length-distribution method.


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    Title :

    Upper-Bound Estimates Of SEU in CMOS


    Contributors:

    Published in:

    Publication date :

    1990-04-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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