Theory of single-event upsets (SEU) (changes in logic state caused by energetic charged subatomic particles) in complementary metal oxide/semiconductor (CMOS) logic devices extended to provide upper-bound estimates of rates of SEU when limited experimental information available and configuration and dimensions of SEU-sensitive regions of devices unknown. Based partly on chord-length-distribution method.
Upper-Bound Estimates Of SEU in CMOS
NASA Tech Briefs ; 14 , 4
1990-04-01
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Englisch
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