Upper bounds on rates of single-event upsets (SEU's) in digital integrated circuits and other electronic devices exposed to anisotropic fluxes of energetic ionizing particles computed by use of improved method. Derived from simplified, worst-case mathematical models of charge-collecting volumes and physical phenomena in electronic devices.


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    Titel :

    Upper-Bound SEU Rates In Anisotropic Fluxes


    Beteiligte:

    Erschienen in:

    Erscheinungsdatum :

    1993-03-01



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch






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