Upper bounds on rates of single-event upsets (SEU's) in digital integrated circuits and other electronic devices exposed to anisotropic fluxes of energetic ionizing particles computed by use of improved method. Derived from simplified, worst-case mathematical models of charge-collecting volumes and physical phenomena in electronic devices.
Upper-Bound SEU Rates In Anisotropic Fluxes
NASA Tech Briefs ; 17 , 3
1993-03-01
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