Upper bounds on rates of single-event upsets (SEU's) in digital integrated circuits and other electronic devices exposed to anisotropic fluxes of energetic ionizing particles computed by use of improved method. Derived from simplified, worst-case mathematical models of charge-collecting volumes and physical phenomena in electronic devices.


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    Title :

    Upper-Bound SEU Rates In Anisotropic Fluxes


    Contributors:

    Published in:

    Publication date :

    1993-03-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English






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