X-ray and gamma-ray technique developed at NASA Langley Research Center enables melt/solid interface to be observed visually during crystal growth by directional solidification in Bridgman furnace. Technique used to observe movement and shape of interface in germanium and in lead tin telluride. Valuable tool in efforts to grow seeded semiconductor materials in Bridgman furnaces.
Imaging Of Directional-Solidification Interfaces
NASA Tech Briefs ; 12 , 2
1988-02-01
Miscellaneous
No indication
English
Process speeds up directional solidification
Tema Archive | 1971
|Directional Solidification of Monotectic Alloys
NTRS | 1983
|Solutal convection during directional solidification
AIAA | 1988
|Directional Solidification Of Monotectic Alloys
NTRS | 1990
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