X-ray and gamma-ray technique developed at NASA Langley Research Center enables melt/solid interface to be observed visually during crystal growth by directional solidification in Bridgman furnace. Technique used to observe movement and shape of interface in germanium and in lead tin telluride. Valuable tool in efforts to grow seeded semiconductor materials in Bridgman furnaces.


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    Title :

    Imaging Of Directional-Solidification Interfaces



    Published in:

    Publication date :

    1988-02-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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