X-ray and gamma-ray technique developed at NASA Langley Research Center enables melt/solid interface to be observed visually during crystal growth by directional solidification in Bridgman furnace. Technique used to observe movement and shape of interface in germanium and in lead tin telluride. Valuable tool in efforts to grow seeded semiconductor materials in Bridgman furnaces.


    Zugriff

    Zugriff über TIB

    Verfügbarkeit in meiner Bibliothek prüfen


    Exportieren, teilen und zitieren



    Titel :

    Imaging Of Directional-Solidification Interfaces



    Erschienen in:

    Erscheinungsdatum :

    01.02.1988



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Modeling Directional Solidification

    Wilcox, W. R. / Paptheodorou, T. | NTRS | 1985


    Modelling directional solidification

    Wilcox, William R. / Neugebauer, Greg / Gray, Ross et al. | NTRS | 1987



    Solutal convection during directional solidification

    MCFADDEN, G. / CORIELL, S. | AIAA | 1988


    Convective instabilities during directional solidification

    MCCAY, T. D. / MCCAY, M. H. / LOWRY, S. A. et al. | AIAA | 1989