Luminescence proposed as nondestructive technique for measuring Shockley-Read-Hall (SRH) recombination lifetime GaAs. Sample irradiated, and luminescence escapes through surface. Measurement requires no mechanical or electrical contact with sample. No ohmic contacts or p/n junctions needed. Sample not scrapped after tested.
Measuring Carrier Lifetime in GaAs by Luminescence
NASA Tech Briefs ; 9 , 3
1986-01-01
Miscellaneous
No indication
English
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