Proposed schlieren system uses two lasers and two knife edges to simultaneously view perpendicular refractive-index gradients in a test volume. It is improvement over conventional schlieren systems, which monitor gradient along only one axis. Although originally developed to monitor materials-processing experiments in space, it should find application wherever there is need to study two-dimensional temperature, pressure, concentration or other gradients related to index of refraction.
Dual-Laser Schlieren System
NASA Tech Briefs ; 6 , 1
1982-09-01
Miscellaneous
No indication
English
Laser Diode Schlieren Photography
NTRS | 1984
|Laser Schlieren Crystal-Growth Imager
NTRS | 1986
|Large-Field Laser Holographic Focusing Schlieren System
Online Contents | 1993
|Laser Alignment Method for Portable Schlieren System
AIAA | 2009
|Laser Alignment Method for Portable Schlieren System
British Library Conference Proceedings | 2009
|