Proposed schlieren system uses two lasers and two knife edges to simultaneously view perpendicular refractive-index gradients in a test volume. It is improvement over conventional schlieren systems, which monitor gradient along only one axis. Although originally developed to monitor materials-processing experiments in space, it should find application wherever there is need to study two-dimensional temperature, pressure, concentration or other gradients related to index of refraction.


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    Title :

    Dual-Laser Schlieren System


    Contributors:

    Published in:

    Publication date :

    1982-09-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


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