Crystal observed as it grows from melt with aid of laser schlieren imaging. Observation method allows entire perimeter of growing crystal to be inspected. Isolated crystal facets examined, convection flows and temperature and concentration gradients revealed. Method does not require contact with, or proximity to, crystal.


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    Title :

    Laser Schlieren Crystal-Growth Imager


    Contributors:

    Published in:

    Publication date :

    1986-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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