Proposed schlieren system uses two lasers and two knife edges to simultaneously view perpendicular refractive-index gradients in a test volume. It is improvement over conventional schlieren systems, which monitor gradient along only one axis. Although originally developed to monitor materials-processing experiments in space, it should find application wherever there is need to study two-dimensional temperature, pressure, concentration or other gradients related to index of refraction.


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    Titel :

    Dual-Laser Schlieren System


    Beteiligte:
    Owen, R. B. (Autor:in) / Wintherow, W. K. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.09.1982



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


    Laser Diode Schlieren Photography

    Franke, J. M. / Burner, A. W., Jr. | NTRS | 1984


    Laser Schlieren Crystal-Growth Imager

    Owen, R. B. / Johnston, M. H. | NTRS | 1986


    Large-Field Laser Holographic Focusing Schlieren System

    Doggett, G.P. | Online Contents | 1993


    Laser Alignment Method for Portable Schlieren System

    Pierce, Adam / Lu, Frank | AIAA | 2009


    Laser Alignment Method for Portable Schlieren System

    Pierce, A. / Lu, F. / American Institute of Aeronautics and Asronautics | British Library Conference Proceedings | 2009