Technique employs x-ray scanning system to measure thickness of topcoat and subcoat of heat shields and other ceramic materials. System scans sample in raster pattern and depicts image of structure on cathode-ray-tube for viewing or photocopying within seconds.


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    Title :

    Measurement of subcoat thickness by characteristic x-rays


    Contributors:

    Published in:

    Publication date :

    1979-03-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


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