Technique employs x-ray scanning system to measure thickness of topcoat and subcoat of heat shields and other ceramic materials. System scans sample in raster pattern and depicts image of structure on cathode-ray-tube for viewing or photocopying within seconds.
Measurement of subcoat thickness by characteristic x-rays
NASA Tech Briefs ; 3 , 4
1979-03-01
Sonstige
Keine Angabe
Englisch
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