Technique employs x-ray scanning system to measure thickness of topcoat and subcoat of heat shields and other ceramic materials. System scans sample in raster pattern and depicts image of structure on cathode-ray-tube for viewing or photocopying within seconds.


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    Titel :

    Measurement of subcoat thickness by characteristic x-rays


    Beteiligte:
    Harris, W. J. (Autor:in) / Quinn, R. A. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    1979-03-01



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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