System uses window itself as principal element of well-known attenuated total reflection technique frequently used for spectroscopic analysis of thin films. Monitor includes notch in monitored window, which acts as beam splitter to reflect portion of light at less than critical angle and causes total internal reflection.


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    Title :

    Monitor for optical-window contamination


    Contributors:

    Published in:

    Publication date :

    1977-01-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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