Compact instrument gives instantaneous reading of accumulation of small particles on glass plate. Instrument is sensitive to particles as small as one hundred microns and should be adaptable to monitoring particulate air pollution or dust levels in semiconductor clean rooms. Dual collimated light sources produce highly monochromatic radiation direct at grazing single angle onto glass plate.
Dust-contamination monitor
NASA Tech Briefs ; 2 , 3
1977-11-01
Miscellaneous
No indication
English