System uses window itself as principal element of well-known attenuated total reflection technique frequently used for spectroscopic analysis of thin films. Monitor includes notch in monitored window, which acts as beam splitter to reflect portion of light at less than critical angle and causes total internal reflection.
Monitor for optical-window contamination
NASA Tech Briefs ; 1 , 3
01.01.1977
Sonstige
Keine Angabe
Englisch
NTRS | 1968
|NTIS | 1968
|NTRS | 1977
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