System uses window itself as principal element of well-known attenuated total reflection technique frequently used for spectroscopic analysis of thin films. Monitor includes notch in monitored window, which acts as beam splitter to reflect portion of light at less than critical angle and causes total internal reflection.


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    Titel :

    Monitor for optical-window contamination


    Beteiligte:
    Harnett, L. N. (Autor:in)

    Erschienen in:

    Erscheinungsdatum :

    01.01.1977



    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch


    Schlagwörter :


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