Ellipsometer, used with ultrahigh vacuum, allows measurement of varied angles of incidence. Vacuum chamber, directly incorporated into optical bench systems, allows varied angle measurements to be taken through same region of a window.


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    Title :

    Ellipsometer for measurement in ultrahigh vacuum


    Contributors:

    Published in:

    Publication date :

    1976-03-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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