Devices are used in inspection of contact resistance in plated connectors after assembly into cables. System permits rapid inspection of connectors when mating connectors or special apparatus are not available, and enables source of excessive resistance to be precisely determined.
Contact-resistance test probes: A concept
1971-12-01
Miscellaneous
No indication
English
TIBKAT | 1989
|A novel concept for reducing thermal contact resistance
AIAA | 1982
|A novel concept for reducing thermal contact resistance
AIAA | 1984
|Probes for electronics test applications
Emerald Group Publishing | 2002