Devices are used in inspection of contact resistance in plated connectors after assembly into cables. System permits rapid inspection of connectors when mating connectors or special apparatus are not available, and enables source of excessive resistance to be precisely determined.


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    Title :

    Contact-resistance test probes: A concept


    Contributors:

    Publication date :

    1971-12-01


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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