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    Title :

    Probes for electronics test applications



    Publication date :

    2002-12-01




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English





    Contact-resistance test probes: A concept

    Brooks, C. H. / Maxwell, J. H. / Mc Dermott, R. J. | NTRS | 1971




    Applications of electronics

    Cooper, G.R. | Engineering Index Backfile | 1945