Devices are used in inspection of contact resistance in plated connectors after assembly into cables. System permits rapid inspection of connectors when mating connectors or special apparatus are not available, and enables source of excessive resistance to be precisely determined.


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    Titel :

    Contact-resistance test probes: A concept


    Beteiligte:
    Brooks, C. H. (Autor:in) / Maxwell, J. H. (Autor:in) / Mc Dermott, R. J. (Autor:in)

    Erscheinungsdatum :

    01.12.1971


    Medientyp :

    Sonstige


    Format :

    Keine Angabe


    Sprache :

    Englisch




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