High Reliability Screening of Semiconductor and Integrated Circuit Devices
1967
161 pages
Report
No indication
English
Resistive, Capacitive, & Inductive Components , Circuit reliability , Integrated circuit , Nondestructive testing , Semiconductor device , Bibliography , Circuit , Data , Destruction , Destructive testing , Device , Digital , Failure , Integration , Mechanism , Nondestructive , Reliability , Screening , Semiconductor , Specification , Technique , Testing
Reliability aspects of semiconductor devices in high temperature applications
Tema Archive | 2003
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