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    Title :

    High reliability screening of semiconductor and integrated circuit devices


    Contributors:
    Lombardi, J. (author) / McDonough, L. (author) / Padden, H. (author)


    Publication date :

    1967


    Size :

    XIII, 149 S


    Remarks:

    Ill., graph. Darst
    Contract No. NAS 5-9639
    Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek


    Type of media :

    Report


    Type of material :

    Print


    Language :

    English



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