Access

    Go to TIB AV-Portal


    Export, share and cite



    Title :

    Materials Testing - Scanning Electron Microscopy


    Subtitle :

    Lecture


    Contributors:

    Published in:

    Publication date :

    2022-01-01


    Size :

    46 MB



    Type of media :

    Audio-visual


    Type of material :

    Audio-visual


    Language :

    English




    In-Situ Fatigue Crack Growth Testing of Al7075-T651 under Scanning Electron Microscopy

    Zhang, W. / Liu, Y. / American Institute of Aeronautics and Astronautics | British Library Conference Proceedings | 2011


    Scanning probe microscopy for testing ultrafast electronics

    Hou, A.S. / Nechay, B.A. / Ho, F. et al. | IEEE | 1995



    Scanning Electron Microscopy in the Rubber Industrie.

    Smith,R.W. / Goodrich | Automotive engineering | 1975


    Scanning Electron Microscopy in the Rubber Industry

    Smith, Ronald W. | SAE Technical Papers | 1975



    Preview

    Preview Image