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    Title :

    In-Situ Fatigue Crack Growth Testing of Al7075-T651 under Scanning Electron Microscopy


    Contributors:
    Zhang, Wei (author) / Liu, Yongming (author)

    Conference:

    52nd AIAA/ASME/ASCE/AHS/ASC Structures, Structural Dynamics and Materials Conference



    Publication date :

    2011-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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