Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed.
Built-in test maturation concepts using test program set and relational database technologies
IEEE Aerospace and Electronic Systems Magazine ; 11 , 3 ; 35-40
1996-03-01
869290 byte
Article (Journal)
Electronic Resource
English
Built-in Test Maturation Concepts
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