Aspects of the present disclosure provide a method generally including obtaining one or more built-in self-test (BIST) patterns, each pattern including a series of instructions, applying a compression scheme to generate one or more compressed BIST patterns, wherein the compression scheme encodes an operation and data field of instructions to generate encoded instructions, each encoded instruction having an identifier (ID) field and a variable number of data bytes, wherein the ID field identifies a type of the operation and indicates the variable number of data bytes, and storing the compressed BIST patterns.


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    Title :

    BUILT-IN SELF-TEST ENHANCEMENTS


    Contributors:

    Publication date :

    2024-09-26


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    English


    Classification :

    IPC:    G01R Messen elektrischer Größen , MEASURING ELECTRIC VARIABLES / B60L PROPULSION OF ELECTRICALLY-PROPELLED VEHICLES , Antrieb von elektrisch angetriebenen Fahrzeugen / G06F ELECTRIC DIGITAL DATA PROCESSING , Elektrische digitale Datenverarbeitung / G11C Statische Speicher , STATIC STORES



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    GAO JING / KOCH BRIAN J / XIAO XINGCHENG et al. | European Patent Office | 2023

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