Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed.
Built-in test maturation concepts using test program set and relational database technologies
IEEE Aerospace and Electronic Systems Magazine ; 11 , 3 ; 35-40
01.03.1996
869290 byte
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
Built-in Test Maturation Concepts
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