Our studies of device lifetime and the main degradation mechanisms in Nichia blue LEDs date back to Spring 1994. Following the initial studies of rapid failures under high current electrical pulses, where metal migration was identified as the cause of degradation, we have placed a number of Nichia NLPB-500 LEDs on a series of cw life tests. This work reviews the failure analysis that was performed on the degraded devices and the degradation mechanisms that were identified.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Life tests and failure mechanisms of GaN-AlGaN-InGaN light emitting diodes


    Contributors:
    Barton, D.L. (author) / Osinski, M. (author)


    Publication date :

    1998-01-01


    Size :

    215670 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Life Tests and Failure Mechanisms of GaN/AlGaN/InGaN Light Emitting Diodes

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1998


    Life tests of Nichia AlGaN/InGaN/GaN blue-light emitting diodes [2683-13]

    Helms, C. J. / Berg, N. H. / Barton, D. L. et al. | British Library Conference Proceedings | 1996


    400nm InGaN/GaN and InGaN/AlGaN multiquantum well light-emitting diodes

    Chang, S.J. / Kuo, C.H. / Su, Y.K. et al. | IEEE | 2003


    400nm InGaN/GaN and InGaN/AlGaN Multiquantum Well Light-emitting Diodes

    Chang, S. J. / Kuo, C. H. / Su, Y. K. et al. | British Library Conference Proceedings | 2003


    Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes (Invited Paper) [3004-16]

    Osinski, M. / Barton, D. L. / Helms, C. J. et al. | British Library Conference Proceedings | 1997