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    Title :

    Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes (Invited Paper) [3004-16]



    Conference:

    Conference, Fabrication, testing, and reliability of semiconductor lasers II ; 1997 ; San Jose; CA



    Publication date :

    1997-01-01


    Size :

    9 pages




    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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