Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes (Invited Paper) [3004-16]
Conference, Fabrication, testing, and reliability of semiconductor lasers II ; 1997 ; San Jose; CA
1997-01-01
9 pages
Aufsatz (Konferenz)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Life Tests and Failure Mechanisms of GaN/AlGaN/InGaN Light Emitting Diodes
British Library Conference Proceedings | 1998
|400nm InGaN/GaN and InGaN/AlGaN Multiquantum Well Light-emitting Diodes
British Library Conference Proceedings | 2003
|Vertical-cavity surface-emitting lasers: the applications (Invited Paper) [3004-13]
British Library Conference Proceedings | 1997
|Life tests of Nichia AlGaN/InGaN/GaN blue-light emitting diodes [2683-13]
British Library Conference Proceedings | 1996
|