This paper describes how a micromachined, fiber-coupled, freestanding photoconductive probe is fabricated and then implemented to perform high temporal-, spatial-, and voltage-resolution measurements at the interior nodes of integrated circuits. This high-impedance, noninvasive probe has been utilized not only for temporal measurements of clocked microwave-digital ICs and nonlinear microwave circuits, but also to perform swept-frequency internal network measurements of MMICs. It has proven itself to be a valuable resource for isolating faults within circuits and for providing direct results that can be used for validating models and designs.
Advances in optically-based sampling for diagnostics of microwave digital and analog circuits
1999-01-01
176994 byte
Conference paper
Electronic Resource
English
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